NCG030301 DMR SW (2)

4
Semi-annual Stormwater Discharge Monitoring Report
for North Carolina Division of Water Quality General Permit No. NCG030000
Date submitted S' � "1 S -
CERTIFICATE OF COVERAGE No, N0003 0 3— —0 4
FACILITY NAME & 61"10 /S514S IZGJ.dQ A-1- -;"'L .sN�
COUNTY_ WR,/NE _ R
PERSON COLLECTING SAMPLES
Cert. #
Comments on sample collection or analysis:
SAMPLE COLLECTION YEAR a0%S
SAMPLE PERIOD B7an-June ❑ July -Dec
or ❑ Monthly" (month)
DISCHARGING TO CLASS 0611W E -"QW [Mout BPNA
[]Zero -flow ❑Water supply ❑SA
RP^F`1/r[j ❑Other
JUN 0 G 2015 PLEASE REMEMBER TO SIGN ON PAGES 2 AND/OR 3 4
Part A: Stormwater Benchmarks and Monitoring Results 014 SECT ION
INFORMATION PROCESSING UNIT ❑ No discharge this period22
Date Sample
Outfall No. Collected"
(mo/dd/yr)
24-hour rainfall
amount, Total Suspended Solids
Inches3
pH, Non -Polar O&G/ Total Toxic
Standard units Copper Lead Zinc Total Petroleum Organicss
Hydrocarbons
Benchmarks ===> -
- 100 mg/L or 50 mg/L4
6.0-9.0 0.007 mg/L 0.03 mg/L 0.067 mg/L 15 mg/L 1 mg/L
S 5-�1 • �
. S .� .as c,
5►9 �0.005� Lo.00Lso � .ot�� � .00
1 Monthly sampling (instead of semi-annual) must begin with the second consecutive benchmark exceedance for the same parameter at the same outfall.
2 For sampling periods with no discharge at any single outfall, you must still submit this discharge monitoring report with a checkmark here.
3The total precipitation must be recorded using data from an on-site rain gauge. Unattended sites may be eligible for a waiver of the rain gauge requirement.
4 See General Permit, Table 3 identifying the especially sensitive receiving water classifications where the more protective benchmark applies.
s Total Toxic Organics sampling is applicable only for those facilities which perform metal finishing operations, manufacture semiconductors, manufacture electronic
crystals, or manufacture cathode ray tubes. For purposes of this permit the definition of Total Toxic Organics is that definition contained in the EPA Effluent
Guidelines for the facility subject to the requirement to sample (for metal finishing use the definition as found in 40 CFR 433.11; for semiconductor manufacture use
the definition as found in 40 CFR 469.12; for electronic crystal manufacture use the definition as found in 40 CFR 469.22; and for cathode ray tube manufacture use
the definition found in 40 CFR 469.31).
PERMIT DATE: 11/1/2012-10/31/2017 SWU-245, LAST REVISED 10/25/2012
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