HomeMy WebLinkAboutNCG030305_DMR_20210330Stormwa'ter Discharge Monitoring Report
for North Carolina Division of Energy, Mineral and land Resources General Permit No. NCGO30000
Date submitted -9 Pba.1
CERTIFICATE OF COVERAGE No. NCG03f�_3 05 SAMPLE COLLECTION YEAR
FACILITY NAME FJO3 'f f/C I I r nlei! &R*A.L-Q) SAMPLE PERIOD Jan -June
COUNTY�pQpp�0 J or KI Monthly
PERSON COLLECTiN PLES I , pS DISCHARGING TO CLASS �t
LABORATORY I()r — Lab Cert. #M;
Comments on
Part A: Stormwater Benchmarks and Monitoring Results
RECEIVED
supply
APR 19 2021 PLED,SEREMEMBERTosiU'NONPAGES 2AND/OR3 -�
CENTRAL FILES
C'd'dR SECTinni rcpv
OutfallNo
ParaBenc
Parameter
Parameter Code
Date Sample
Collected'
(moJ.dd/yr)
_
-
24-hourrainfall
amount,
inches
46529
Total Suspended Solids
100 mg/L or 50 Milo
C0530
pH,
Standard units
6.0 - 9.0
00400
-'
Total Copper
0.010 mg/L
02119
Jvo
Total Lead
D.075 mg/L
01051
aiscnarge this
Total Zinc
0.125 mg/1
01094
eriod?e
Nan-PolarO&G/
Total Petroleum
Hydrocarbons
15 mg/L
OOS52
Total Toxic
Or nits
1 mg/L
'7B141
'Monthlysamplins(insteadofsemi-nnn„anm
_____�______..4._
'Forsam I(n """eCOM COuaecuuve oecnmarxexceeaancefor the same parameter atthesame outfalL
sampling periods with no discharge at any single outfall, you must still submit this discharge monitoring report with a checkmaric here.
'The total precipitation must be recorded using data from an on -site rain gauge. Unattended sites may be eligible for a waiver of the rain gauge requirement.
4See General Permit, Section 8,Table Ito identify the especially sensitive receiving water classifications where the more protective benchmark applies.
5Total Toxic Organics sampling is applicable only for those facilities which perform metal finishing operations, manufacture semiconductors, manufacture
electronic crystals, or manufacture cathode ray tubes. For purposes of this permit the definition of Total Toxic Organics is that definition contained In the EPA
Effluent Guidelines forthe facility subject to the requirement to sample (for metal finishing use the definition as found in 40 CFR 433.11; for semiconductor
manufacture use the definition as found in 40 CFR 469.12; for electronic crystal manufacture use the definition as found in 40 CFR 469.22; and for cathode ray
tube manufacture use the definition found in 40 CFR 469.31).
Permit Date: 1V:L/2o18-o5/31/2021 SWU-245, last revised 11/1/2o18
Page 1 of 3
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